Magnetic recording medium, method for manufacturing recording medium and magnetic recordation apparatus

ABSTRACT

A grain diameter controlling crystalline layer comprising crystalline grains of a metal selected from the group consisting essentially of Cu, Ni, Rh and Pt was formed on a substrate. Then, deposited atom layer of at least one element selected from the group consisting of oxygen and carbon was formed on the surface of the grain diameter control layer. A magnetic recording layer was deposited on the atoms deposited grain diameter controlling crystalline layer. Then a magnetic recording medium in which the magnetic crystalline grains has small grain diameter and small grain diameter distribution, and the magnetic recording medium shows increased signal to noise ratio at high recording density.

CROSS-REFERENCE TO RELATED APPLICATIONS

This is a divisional application of co-pending U.S. patent applicationSer. No. 11/085,622, filed on Mar. 22, 2005, which claims priority toprior Japanese Patent Application No. 2004-090670, filed on Mar. 25,2004; the entire contents of both of which are incorporated herein byreference.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to magnetic recording media, methods formanufacturing recording media and a magnetic recording apparatus, inparticular, to magnetic recording media having high recording density,methods for manufacturing the recording media and magnetic recordingapparatus such as hard disk drives in which the high-density recordingmedia are equipped.

2. Description of the Related Art

Hard disk drives (HDDs) have been expanding their application scope fromthe first computer related application to various other applications,such as home video recorder and car carrying navigation systemapplications as magnetic recording systems for recording and reproducinginformation. The expansion is due to their advantage such as high dataaccess speed and high data storage reliability, in addition to theirhigh recording capacity performance with low cost. Requirements for HDDswith larger recording capacity have been increased with the expansion ofthe HDD application scope. Replying to the requirements, large capacityrecording technology has been advanced by increasing recording densityof the magnetic recording media.

With increasing recording density of the magnetic recording media ofHDDs, the recording bit sizes and the diameters for the magnetizationreversal units became very small. As the result, a decreasing ofrecorded signal magnetization caused by thermal fluctuation and thatresults to a degrading of the recording and reproducing performancebecame notable for the very small magnetization reversal units.Furthermore, noise signals which appear at boundary regions betweenrecording bits became large as a result of decreasing recording bits toa very small size, and the noise gave large influences upon the signalto noise ratio. Therefore, in order to attain higher recording density,it is required to stabilize thermal stability of the-recorded signalmagnetization at one hand, it is also required to attain low noisecharacteristics at high recording density at the other hand.

To decrease magnetic recording medium noise, size of magneticcrystalline grains constructing recording layer have been made smallerup to now. For example, magnetic crystalline grains of Co—Cr magneticlayer of widely used magnetic recording media were made small by addingsmall amount of Ta or B (refer to Japanese Patent Laid-open ApplicationsNos. HEI 11-154321 and 2003-338029), and by precipitating nonmagnetic Crby heat treating at appropriate temperature (refer to Japanese PatentLaid-open Applications Nos. HEI 3-235218, and HEI 6-259764). Recently,methods for obtaining magnetic recording layers having so calledgranular structure by adding oxides such as SiO, to the magnetic layerwere applied. In the granular structured magnetic layer, nonmagneticgrain boundary materials enclose magnetic crystalline grains (refer toJapanese Patent Laid-open Applications Nos. HEI 10-92637, and2001-56922).

These methods, however, cannot control the crystalline grains of themagnetic-layer and the under-layer by going back to the nucleationprocesses for the crystalline grains of the under-layer and the magneticrecording layer. These methods control average magnetic crystallinegrain diameter and grain boundary regions merely by choosing combinationof raw materials, the raw material composition, or by choosing ofdepositing conditions. When the crystalline grains in the under-layerare made smaller, the crystalline quality and crystal orientation degreeof the grains in the under-layer are degraded, and the degradedcrystalline grains of the under-layer influence upon the formation ofmagnetic crystalline grains. Actually it was found that the magneticlayer prepared using this method showed broad grain size distributionand broad distribution of grain boundary width. Magnetic recording mediadecreasing the average grain size of the magnetic crystalline grains to5 nm showed poor thermal fluctuation durability. Very small grainsunstable to thermal fluctuation were included at large fraction. Then itwas difficult to attain further high density using this method.

To obtain low noise magnetic recording medium having small magneticcrystalline grains, nucleation of magnetic crystalline grains werecontrolled using a layer of such as Nb for nucleation layer on asubstrate for forming magnetic recording layer (refer to Japanese PatentLaid-open Application No. 2002-22518). To attain higher recordingdensity realizing thermal stability of recording magnetization and lownoise, however, further additional advanced technology was needed.

SUMMARY

The important problems to be solved in order to attain higher recordingdensity are to realize small average grain diameter of magneticrecording layer to obtain low noise magnetic recording medium and smallgrain diameter dispersion diminishing very small particles unstable tothermal fluctuation.

The present invention is directed to give a solution to the problems.The purpose of the present invention is to present a novel magneticrecording medium having excellent recording signal resolution and signalto noise ratio (SNR) realizing small average grain diameter dispersion,methods for manufacturing the magnetic recording medium, and magneticrecording apparatus equipped with the recording medium.

The inventors of the present invention have performed various exploringwork and have got interesting finding that the magnetic crystallinegrains of the magnetic layer can be made small with very small grainsize distribution when the magnetic recording layer is formed on a filmof oxide or carbon deposited Cu, Ni, Rh or Pt film. After carrying out afurther investigation, the inventors could solve the problems describedabove and completed the present invention.

The magnetic recording medium of the present invention comprises asubstrate, an under-layer formed on the substrate, and a magneticrecording layer on the under-layer formed on the magnetic recordinglayer. The under-layer of the present invention includes grain diametercontrol under-layer comprising crystalline grains of a metal selectedfrom the group consisting essentially of Cu, Ni, Rh and Pt, and adeposited layer of at least one element selected from the groupconsisting of oxygen and carbon on the grain diameter control layersurface.

The method for producing magnetic recording medium of the presentinvention comprises a process for forming a grain diameter controlunder-layer comprising crystalline grains of a metal selected from thegroup consisting essentially of Cu, Ni, Rh and Pt on a substrate, aprocess for forming an deposited atom layer depositing atoms of at leastone element selected from the group consisting of oxygen and carbon onthe grain diameter control layer surface, and a process for forming amagnetic recording layer on the substrate having the atom depositedgrain diameter control under layer.

Furthermore, the magnetic recording and reproducing apparatus of thepresent invention comprises the magnetic recording medium describedabove, a recording medium driving mechanism, driving the magneticrecording medium, a recording and reproducing head mechanism, recordinginformation to the magnetic recording medium and reproducing from themagnetic recording medium, a head driving mechanism, driving therecording and reproducing head and a recording and reproducing signalprocessing system, processing

The present invention has a remarkable advantage in the point that thecrystalline grain size of the grain diameter control under-layercomprising crystalline grains is not needed to be small for obtainingsmall magnetic crystalline grains. The problem of employing small grainsize under-layers, therefore, can be avoided to obtain small magneticgrains. The present invention presents a novel means for obtainingmagnetic recording medium having increased recording and reproducingcharacteristics.

The detailed mechanism of obtaining small grain sizes by using graindiameter control under-layer comprising crystalline grains of a metalselected from the group consisting essentially of Cu, Ni, Rh and Pt, isnot clear at present. Here, two papers concerned with reorientation ofatoms such as oxygen or carbon on clean metal single crystal surface areintroduced and a comparison between the present invention and the twopapers are given.

In one of the papers appeared in Surface Science Vol. 437 pp 18-28,regularly rearranged surface structure of deposited oxygen atoms andcarbon atoms on Ni, and Rh surface cleaned up in high vacuum isreported.

In the other paper appeared in Materials Science and Engineering Vol.B96 pp. 169-177, an explanation for the ordered arrangement is given bystress interaction appeared on the clean bulk single crystal surface.

Comparing the present invention with the two papers on orderedarrangement of the nitrogen atoms described in the two papers, it can bepointed out that the under-layer in the present invention is films ofCu, Ni, Rh or Pt, and not of a bulk single crystal. The state havingstress in the thin film of the present invention is quite different fromthe bulk Cu single crystal surface of these papers. Therefore, there-oriented ordered surface structure shown in the papers cannot beexpected for the film of the present invention. At present, themechanism of the present invention obtaining small grain size is notclear. To find out the mechanism of the present invention is animportant problem to be solved.

Descriptions about absorbing oxygen and absorbing nitrogen are found inthe Japanese Patent Laid-open Application No. 2002-22518 mentionedabove. In this patent application, Nb containing alloy under-layer forobtaining small crystalline grains is described. As an example of theinvention, physical absorption of oxygen and nitrogen to the under layeris described. In this case, notable effect found in the presentinvention is not obtained possibly because the absorbed oxygen andnitrogen are absorbed on Nb substrate and not on Cu, Ni, Rh or Pt.Furthermore, oxygen, fluorine and nitrogen contained magnetic recordingmedium is described in Japanese Patent Laid open Application No. HEI5-128481. Notable effect found in the present invention is not obtainedin this case, because oxygen, fluorine and nitrogen are contained in itssubstrate to obtain an effect similar to a textured structure and arenot deposited on the under-layer.

The present invention provides a novel means for obtaining magneticlayer having very small magnetic crystalline grains and magneticrecording media for high density recording having increased signal tonoise ratio.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematically drawn cross section view of a magneticrecording medium according to an embodiment of the present invention.

FIG. 2 is a schematically drawn in-plane view of a magnetic recordinglayer for a magnetic recording medium showing magnetic crystallinegrains arranged in a form of a tetragonal lattice structure according toan embodiment of the present invention.

FIG. 3 is a schematically drawn example of a ring pattern for thereciprocal lattice for the tetragonal lattice structure.

FIG. 4 is a schematically drawn a in-plane view of a magnetic recordinglayer for a magnetic recording medium showing magnetic crystallinegrains arranged in a form of a hexagonal lattice structure according toan embodiment of the present invention.

FIG. 5 is a schematically drawn example of ring pattern for thereciprocal lattice for the hexagonal lattice structure.

FIG. 6 is a schematically drawn cross section view of a magneticrecording medium comprising an orientation control under-layer accordingto an embodiment of the present invention.

FIG. 7 is a schematically drawn cross section view of a magneticrecording medium having an intermediate under-layer according to anembodiment of the present invention.

FIG. 8 is a schematically drawn cross section view of a magneticrecording medium having a soft magnetic under-layer according to anembodiment of the present invention.

FIG. 9 is a schematically drawn schematically drawn cross section viewof a magnetic recording medium having a biasing layer for a softmagnetic under-layer according to an embodiment of the presentinvention.

FIG. 10 is a schematically shown oblique view of a magnetic recordingapparatus according to an embodiment of the present invention showingthe construction by partially removing the covers.

FIG. 11 is a graph showing the relation between the quantity ofdeposited oxygen atoms and the average grain diameter of the magneticrecording layer of Example 1.

FIG. 12 is a graph showing the relation between the quantity ofdeposited carbon atoms and the average grain diameter of the magneticrecording layer of Example 1.

FIG. 13 is a graph showing the relation between the average diameter ofNi and the average grain diameter of the magnetic recording layer ofExample 1.

FIG. 14 is a graph showing the relation between the average diameter ofNi and the average grain diameter of the magnetic recording layer ofExample 1.

FIG. 15 is a graph showing the relation between the areal density ofmagnetic crystalline grains and the dPW₅₀ of the magnetic recordinglayer of Example 1.

FIG. 16 is a graph showing the relation between the areal density ofmagnetic crystalline grains and the dPW₅₀ of the magnetic recordinglayer of Example 1.

DETAILED DESCRIPTION

Hereinafter, embodiments of the present invention will be described indetail with reference to the drawings.

FIG. 1 is a schematically shown cross section view of a magneticrecording medium according to an embodiment of the present invention. Agrain diameter controlling under layer 12 a of at least one selectedfrom Cu, Ni, Rh, and Pt is disposed on a substrate 11 shown in FIG. 1. Adeposited atom layer 12 b of at least one element selected from thegroup consisting of oxygen and carbon is formed on the diameter controlunder-layer 12 a. A magnetic recording layer 14 is disposed on thedeposited atom layer 12 b, and a protective and lubricant layer 15 isformed on the magnetic recording layer 14.

Quantity of the deposited oxygen or carbon atoms desirable for thedeposited atom layer 12 b on the surface of the grain diameter controlunder-layer 12 a is in a range from 1×10¹³ atoms/cm² to 1×10¹⁵ atoms/cm²expressed by average number of atoms per unit area. When the quantity isless than 1×10¹³ atoms/cm², notable average grain diameter decreasingeffect on the magnetic recording layer cannot be obtained. Furthermore,magnetic crystalline grain orientation of the magnetic recording layerdecreases when the quantity is larger than 1×10¹⁵ atoms/cm². Thequantity of the deposited oxygen or carbon atoms is more desirable to bein a range from 5×10¹³ atoms/cm² to 5×10¹⁴ atoms/cm².

Number and position of oxide atoms and carbide atoms can be evaluated bya secondly ion mass spectroscopy (SIMS) method. Other methods forexample, nuclear reactor analysis (NRA) using high energy hydrogen ionsor deuteron ions radiation as reported in Applied Physics Letters Vol.80 pp. 1803-1805 and Applied Physics Letters Vol. 61 pp. 327-329,Rutherford back scattering, X-ray photoelectron spectroscopy (XPS), andAuger electron spectroscopy (AES) can be used for evaluating the numberof the atoms. Furthermore, atom probe method described in AppliedPhysics Letters Vol. 69 pp. 3095-3097 can be used for the evaluation.

As a means for depositing oxygen atoms on the surface of grain diametercontrol under-layer 12 a, a method of exposing grain diameter controlunder-layer 12 a after deposition to oxygen atmosphere, oxygen plasma oroxygen radicals can be applied. As a means for depositing carbon atoms,a method of exposing to ethylene or acetylene atmosphere can similarlybe applied. Other methods of exposing to carbon monoxide atmosphere canbe applied to deposit both oxygen and carbon to the surface.

The crystalline grains desirable for the grain diameter controlunder-layer 12 a are grains having broader flat surface for obtainingthe magnetic recording layer 14 with better crystallinity. Accordingly,larger average grain diameter of the Cu grains is desirable. Thedesirable average grain diameter of the Cu grains is 50 nm or larger,and more desirable average grain diameter is 100 nm or larger. A singlecrystal film having no grain boundary is much more desirable. When thefilm is uneven at a certain degree, the film can be available providedthat the film has large fraction of terrace surfaces that form the filmsurface.

The grain diameter control under-layer 12 a in which the samecrystallographic face of each grain is oriented parallel to the sameplane is desirable because higher magnetic crystalline grain orientationcan be obtained in the magnetic recording-layer 14. For the graindiameter control under-layer 12 a having Cu, Rh, and Ni crystallinegrains, grain orientation of their (100) planes parallel to thesubstrate surface is desirable, and for the grain diameter controlunder-layer 12 a having Pt crystalline grains, grain orientation oftheir (111) planes parallel to the substrate surface is desirable forobtaining significantly small size magnetic crystalline grains in themagnetic recording layer 14.

The magnetic crystalline grains in the magnetic recording layer 14 areformed in plural per one crystalline grain of the grain diameter controllayer 12 a on average. The desirable average areal density of themagnetic crystalline grains in the magnetic recording-layer is in arange from 1×10¹² grains/cm² to 8×10¹² grains/cm² for obtaining largereproduced output of the recorded signal. When the average areal densityof the magnetic crystalline grains is less than 1×10¹² grains/cm², theSNR decreases and when the average areal density is above 8×10¹²grains/cm², the SNR decreases again.

The experimental results of the present inventors show that the magneticcrystalline grain arrangement of an ordered structure in a tetragonallattice is desirable, when the grain diameter control under layer 12 acomprises crystalline particles of Cu, Rh, or Ni. The noise level ofrecording and reproducing characteristics can be substantially reducedwhen the ordered structure was formed compared when the orderedstructure arrangement is not formed. FIG. 2 schematically shows anin-plane structure of the magnetic recording layer of the magneticrecording medium. The white subjects express magnetic grains 1.Tetragonal lattice structure arrangement of magnetic crystalline grains1 can be evaluated by image processing and analyzing the transmissionelectron microscope (TEM) in-plane Figures of the magnetic recordinglayer 14.

Using an image processing and analyzing software, a spectrum can beobtained as a result of a fast Fourier transformation of a binary Figureobtained by increasing contrast of a Figure for magnetic crystallinegrains and grain boundary regions. The magnetic crystalline grains canbe regarded to have an-arrangement of tetragonal lattice structureessentially when patterns as shown in FIG. 3 can be recognized in thespectrum. Practically, the arrangement can be confirmed by finding twotype periodical spots or rings having a ratio of the distances to thecenter of 1:1/√2 (R₁ and R₁/2^(1/2) in FIG. 3). Similar evaluation canbe performed using low energy electron diffraction to the magneticrecording layer and analyzing the diffraction patterns.

Experimental results of the present inventors also shows that themagnetic crystalline grain arrangement essentially in an orderedstructure of hexagonal lattice is desirable, when the grain diametercontrol under layer 12 a comprises crystalline particles of Pt since theresolution of the recorded signal is improved. FIG. 4 shows aschematically in-plane structure of the hexagonal lattice arrangement.Hexagonal lattice arrangement can be evaluated by methods similar to thecase for the tetragonal crystal structure, when patterns as shown inFIG. 4 corresponding to a reciprocal lattice of a hexagonal structurecan be recognized. Practically, the arrangement can be confirmed byfinding two type periodical spots or rings having a ratio of thedistances to the center of 1:1/√3 (R₁ and R₁/√3 in FIG. 4).

As shown in FIG. 6, an orientation control under-layer 12 c forincreasing (100) plane orientation of the crystalline grains in thegrain diameter control under-layer 12 a can be disposed between thesubstrate 11 and grain diameter control under-layer 12 a whencrystalline grains of the grain diameter control under-layer 12 a is Cu,Rh, or Ni. As the practical material for orientation control under-layer12 c, at least one selected from the group consisting essentially ofNiAl, MnAl, MgO, NiO, TN, Si, and Ge can be used. The orientationcontrol under-layer 12 c need not be disposed directly adjacent to thegrain diameter control under-layer 12 a.

For the magnetic recording medium of the present invention, a magneticrecording layer 14 having a granular structure is desirable. Theformation of nonmagnetic grain boundary regions of the granularstructure in the magnetic recording layer 14 lead to a decrease in theexchange interaction between magnetic crystalline grains, a decrease inwidth of magnetization transition zone and an increase in recordingresolution of recording and reproducing characteristics.

As the materials for the magnetic recording layer 14, disordered alloyssuch as Co—Cr and Co—Pt, ordered alloys such as Fe—Pt, Co—Pt and Fe—Pd,and multi-layered film materials such as Co/Pt and Co/Pd can bedesirably used. These alloys and multi-layered film materials haveadvantages of high thermal fluctuation durability because thesematerials have high crystalline anisotropy energy. Magnetic propertiesof these alloy and multi-layered materials can be improved by addingsome additive elements such as Cu, Band Cr as necessary.

CoCrPt, CoCrPtB, CoCrPtTa, CoCrPtNd, CoCrPtCu and FePtCu alloys can becited as more desirable materials for the magnetic recording layer 14.

As the materials for composing grain boundary regions of the granularstructure, chemical compounds such as oxides, carbide and nitrides aredesirable. These compounds are suitable for composing grain boundaryregions because these compounds do not form solid solution with thematerials for forming the magnetic crystalline grains described aboveand these compounds can be separated easily. Compounds such as SiOX,TiO_(x), CrO_(x), AlO_(x), MgO_(x), TaOx, SiN_(x), TiN_(x), AlN_(x),TaN_(x), SiC_(x), TiC_(x) and TaC_(x) can be cited as materials forforming the grain boundary regions.

The magnetic recording layer 14 can be double structure or moremulti-layer structure, in which either one of the multi-layers isgranular.

As shown in FIG. 7, an intermediate under-layer 12 d for controllingcharacteristics of magnetic recording layer 14 can be disposed as onelayer of the set of under-layers 12. The crystal orientation degree canbe improved keeping the small average grain diameter and the homogeneityof the diameter by using a granular structured layer as the intermediateunder-layer 12 d. Furthermore, the recording and reproducingcharacteristics can be increased.

As the nonmagnetic crystalline materials of the intermediate under-layer12 d showing granular structure, Pt, Pd, Ir, Ag, Cu, Ru, and Rh can beused. These metal materials are desirable because these metal materialsshow good lattice compatibility with magnetic crystalline grainsdescribed above and can improve crystal orientation degree of themagnetic recording layer.

As the materials for forming grain boundary regions of the intermediateunder-layer 12 d, compounds such as oxides, carbides and nitrides aredesirably used. These compounds are advantageous as the materials forcomposing grain boundary regions because these compounds do not formsolid solution with the nonmagnetic crystalline materials for formingthe magnetic crystalline grains described above, and can easily beseparated. Chemical compounds such as SiO_(x), TiO_(x), CrO_(x),Al0_(x), MgO_(x), TaO_(x), SiC_(x), TiC_(x), and TaC_(x) can be citedfor forming the grain boundary regions. The materials constructing theunder-layer can include magnetic metal provided that the under-layer isnonmagnetic as the whole.

The intermediate under-layer 12 d with a granular structure can beconstructed as multi-layer of two or more layers. The layer need not beplaced adjacent to the magnetic recording layer.

When the magnetic recording medium of the present invention is appliedto a perpendicular magnetic recording medium, a soft magneticunder-layer 16 can be placed between the under-layers and the substrate11 as shown in FIG. 8.

Disposing the soft magnetic under-layer 16 in the magnetic recordingmedium described above, so-called perpendicular double-layered medium,comprising the magnetic recording layer 14 disposed on the soft magneticlayer 15, can be constructed. The soft magnetic under-layer 16 shares apartial function of a magnetic head by returning magnetic flux inducedby the recording magnetic field from a single pole head passinghorizontally through the magnetic recording medium and turning back tothe magnetic head. Therefore, the soft magnetic under-layer 16 placed inthe magnetic recording medium plays a role for giving a sharpperpendicular magnetic field with sufficient magnitude to the magneticrecording layer 14.

For the soft magnetic under-layer 16, for example, CoZrNb, FeSiAl,FeTaC, CoTaC, NiFe, Fe, FeCoB, FeCoN and FeTaN, can be cited.

A biasing layer 17 can be disposed between the soft magnetic layer 16and the substrate 11 as shown in FIG. 9. For the biasing layer 17,in-plane hard magnet film, antiferromagnetic film and so on can beapplied. Magnetic domains are easily formed in the soft magneticunder-layer 16, and magnetic domain walls induce spike like noise. Theformation of magnetic domains can be avoided by applying a magneticfield in one radial direction of the biasing layer 17 and applyingbiasing field to the soft magnetic under-layer 16 placed on the biasinglayer 17. The biasing can be a multi-layered structure with finelydispersed anisotropy field to avoid formation of large magnetic domains.As the material for constructing the biasing layer 17, CoCrPt, CoCrPtB,CoCrPtTa, CoCrPtTaNd, CoSm, CoPt, FePt, CoPtO, CoPtCrO, CoPt—SiO₂,CoCrPt—SiO₂ and CoCrPtO—SiO₂ can be cited.

Glass substrates, Al alloy substrates or Si single crystal substrateswith oxide surface, ceramic substrate and plastic substrates can be usedfor the substrate 11 as nonmagnetic substrates. These inorganicsubstrates plated with NiP, for example, can be used.

Protective and lubricant layer 15 can be formed on the magneticrecording layer 14. For the protective layer of the protective andlubricant layer 15, carbon or diamond like carbon (DLC) can be used.Other materials SiN_(x), SiO_(x), and CN_(x) can be cited as theprotective layer material.

As the method for depositing each layer described above, vacuumevaporation method, every kind of sputtering method, molecular beamepitaxy method, ion beam evaporation method, laser abrasion method andchemical vapor deposition method can be used.

FIG. 10 is oblique view of a magnetic recording apparatus according toan embodiment of the present invention schematically showing theconstruction by partially removing covers.

In FIG. 10, the magnetic disk 101 according to the present invention isattached to the spindle 102, and is driven at a constant rotating speedby a spindle motor not shown in the Figure. The slider 103 having arecording head for recording information and a MR head and reproducingthe recorded information accessing to the surface of the magnetic disk101 is attached at the top of a suspension 104 constructed by a thinplate shaped flat spring. The suspension 104 is connected to one side ofan arm 105 having a bobbin holding a drive coil not shown in the Figure.

At the other side of the arm 105, a voice coil motor 106, a kind oflinear motor, is disposed. The voice coil motor 106 is constructed by amagnetic circuit composed of a drive coil rolled up to a bobbin of arm105, permanent magnet and opposing yokes.

The arm 105 is supported by a ball bearing not shown in the Figure fixedat the upper and lower sides of fixed axis 107, and is driven to swingcircularly by the voice coil motor 106. The voice coil motor 106controls the position of the slider 103 on the magnetic disk 101. In theFIG. 10, a cover 108 is shown partially.

Hereinafter, examples of the present invention will be described toexplain the present invention further in detail.

EXAMPLE 1

Nonmagnetic 2.5 inches glass substrates were put into a vacuum chamberof an ANELVA Co. c-301 type sputtering apparatus. The vacuum chambers ofthe sputtering apparatus were evacuated to 1×10⁻⁶ Pa or less.

Then substrates were heated using an infrared heater up to about 300° C.Keeping the substrate temperature to about 300° C., about 200 nm CoZrNbfilm was deposited as a soft magnetic under-layer, and then an about 30nm Ni film was deposited to each substrate.

Each substrate was then elevated to about 500° C., and exposed to oxideor ethylene atmosphere in a range of 1×10⁻⁵ to 1×10⁻² Pa. After theoxide or ethylene exposure, a 5 nm thick Fe₅₀Pt₅₀ film was deposited asa magnetic recording layer.

Then a 5 nm carbon film was deposited. For the deposition of CoZrNb, Ni,Fe₅₀Pt₅₀ and C films, the Ar gas pressure was controlled to 0.7 Pa, 0.7Pa, 5 Pa and 0.7 Pa, respectively, and as the target material, CoZrNb,Ni, Fe₅₀Pt₅₀, and C, respectively was used. DC sputtering was used forthe sputtering deposition. Power inputted to the targets was fixed to1,000 W for CoZrNb, Fe₅₀Pt₅₀ and C deposition, and varied from in arange from 100 to 1,000 W for Ni deposition.

Samples were prepared using the similar deposition procedure except thatthe Ni described above was replaced by Cu, Rh, Ni and Pt. Furthermore,magnetic recording medium samples having CO₅₀Pt₅₀, Fe₅₀Pt₅₀ andCO₇₀Cr₁₀Pt₁₀ instead of Fe₅₀Pt₅₀ as the magnetic recording layers werefabricated using similar procedure described above. Quantity ofdeposited oxygen or carbon was controlled by the partial pressure ofoxygen or ethylene exposure atmosphere. The crystalline grain diameterof the Cu, Rh, Ni and Pt was varied changing input power to the targets.

After finishing these deposition, protective layer of each preparedsamples was coated with about 1.3 nm thick lubricant ofperfluoropolyether (PFPE) by a dipping method and magnetic recordingmedium samples were obtained.

As Comparative Example 1, conventional perpendicular magnetic recordingmedium samples were fabricated by the following procedure. Nonmagnetic2.5 inches glass substrates were put into the vacuum chambers of thesputtering apparatus and the vacuum chambers were evacuated to 1×10⁻⁶ Paor less. After heating the substrates using an infrared heater up toabout 300° C., 200 nm CoZrNb film as a soft magnetic under-layer, 10 nmTa film as a seed layer, 20 nm Ru film as a under-layer, 15 nmCo₆₅—Cr₂₀—Pt₁₄—Ta₁ layer as a magnetic recording layer, and a 5 nmprotective layer were deposited to each substrate, and then thelubricant was coated similar to the example described above.

For depositing CoZrNb film, Ta film, Ru film and CoCrPtTa film, the Argas pressure was 0.7 Pa, 0.7 Pa, 0.7 Pa, 5 Pa and 0.7 Pa, respectively,and target material was CoZrNb, Ta, Ru and CO₆₅Cr₂₀ Pt₁₄Ta₁,respectively. DC sputtering was used for these deposition. Powerinputted to the targets was fixed to 1,000 W.

The microstructure, the crystalline grain diameters and the grain sizedistribution of each fabricated sample were evaluated by a transmissionelectron microscope (TEM) with accelerating voltage of 400 kV. Thequantity of oxygen and carbon atoms deposited on the each film and itsdistribution toward the depth direction was obtained, using a methodsimilar to the method described in Japanese Patent Laid-open Application2003-338029, from NRA reaction spectra of each reaction of ¹⁶(d,p)¹⁷O,¹⁸O(p,α)¹⁵N, and ¹²C(d,p)¹³C by synchrotron irradiation of hydrogen ionsor deuteron ions to the oxygen and carbon atoms of the samples. Theanalysis was preformed also by SIMS method using Cs⁺.

Recording and reproducing characteristics (read write characteristics,R/W characteristics) of each magnetic recording medium was evaluated byusing a spin stand. The magnetic head applied was a combination of a 0.3μm track width single pole head and a 0.2 μm track width MR head. Thesame measuring condition at a constant magnetic head position of 20 mmfrom the disk center and the magnetic disk rotating speed of 4,200 rpmwas applied.

Signal to noise ratio for derivative waveforms as an output of aderivative circuit (SNR_(m)) was measured and characterized as the SNRof the magnetic recording medium. The measured signal S was output forlinear recording density of 119 kfci, and the measured noise was rootmean square value at 716 kfci. In addition, the half width of thederivative waveforms (dPW₅₀) was evaluated to obtain as an index for theresolution of the recording.

Table 1 shows the average crystalline grain diameter d_(Mag) and thestandard deviation a of the magnetic layer of each magnetic recordingmedium.

TABLE 1 Diameter Atoms Control Magnetic Deposited Under- Recordingd_(Mag) σ Example Layer layer layer (nm) (nm) Example 1-1 Oxygen Cu FePt5.0 1.3 Example 1-2 Oxygen Cu CoCrPt 4.9 1.3 Example 1-3 Oxygen Cu Copt5.4 1.5 Example 1-4 Oxygen Cu FePd 5.4 1.2 Example 1-5 Carbon Cu FePt4.9 1.3 Example 1-6 Carbon Cu CoCrPt 5.0 1.5 Example 1-7 Carbon Cu Copt5.5 1.2 Example 1-8 Carbon Cu FePd 5.3 1.3 Example-9 Oxygen Ni FePt 5.01.4 Example 1-10 Oxygen Ni CoCrPt 4.8 1.1 Example 1-11 Oxygen Ni Copt5.1 1.2 Example 1-12 Oxygen Ni FePd 5.4 1.2 Example 1-13 Carbon Ni FePt5.0 1.4 Example 1-14 Carbon Ni CoCrPt 5.1 1.3 Example 1-15 Carbon NiCopt 5.3 1.4 Example 1-16 Carbon Ni FePd 5.1 1.0 Example 1-17 Oxygen RhFePt 5.1 1.1 Example 1-18 Oxygen Rh CoCrPt 4.9 1.3 Example 1-19 OxygenRh Copt 5.4 1.5 Example 1-20 Oxygen Rh FePd 5.3 1.4 Example 1-21 CarbonRh FePt 4.9 1.4 Example 1-22 Carbon Rh CoCrPt 5.0 1.5 Example 1-23Carbon Rh Copt 5.2 1.3 Example 1-24 Carbon Rh FePd 5.2 1.1 Example 1-25Oxygen Pt FePt 5.1 1.1 Example 1-26 oxygen Pt CoCrPt 5.1 1.2 Example1-27 Oxygen Pt Copt 5.3 1.0 Example 1-28 Oxygen Pt FePd 5.2 1.4 Example1-29 Carbon Pt FePt 5.5 1.4 Example 1-30 Carbon Pt CoCrPt 5.3 1.0Example 1-31 Carbon Pt Copt 5.6 1.1 Example 1-32 Carbon Pt FePd 5.8 1.5Comparative (conventional 7.1 2.5 Example medium)

As shown in Table 1, each magnetic recording medium of the Example 1 hassmaller average crystalline grain diameter with smaller standarddeviation compared with the magnetic recording medium of the ComparativeExample 1.

FIG. 11 and FIG. 12 shows a relationship between the quantity ofdeposited oxygen θ_(o) and carbon θ_(c), respectively, and the averagemagnetic crystalline grain diameter d_(Mag) obtained by a nuclearreaction analysis NRA for Fe₅₀Pt₅₀ magnetic layer and Ni diametercontrol under-layer samples. From this Figure, it can be found that whenthe θ value is in a range from 1×10¹³ atom/cm² to 1×10¹⁵ atom/cm², thecrystalline grains were significantly small and desirable. Similarresults were obtained for the cases of Cu, Rh, and Pt diameter controlunder-layer samples. Similar results were also obtained for the cases ofCO₅₀Pt₅₀, Fe₅₀Pt₅₀ and CO₇₀Cr₁₀Pt₂₀ magnetic layer. For each magneticrecording medium, the fact that deposited oxygen and carbon atoms werefound on diameter control under-layer surface region and not existinsides of the diameter control under-layers was confirmed by a chemicalelement distribution measurement using SIMS toward the depth direction.

FIG. 13 and FIG. 14 show a relationship between the average diameter ofNi crystalline grains d_(Ni) at Ni layer and the average diameter ofmagnetic crystalline grains d_(Mag) for Fe₅₀Pt₅₀ magnetic layers for2×10¹⁴ atom/cm² and 4×10¹⁴ atom/cm² deposited oxygen or carbon. Theaverage grain diameter of the magnetic layer became significantly smallwhen the average grain diameter of Ni layer is 50 nm or larger than 50nm. Similar result was obtained for samples for Cu, Rh, and Pt graindiameter control under-layer.

FIG. 15 and FIG. 16 shows dPW₅₀ plotted as a function of average arealdensity of magnetic crystalline grains n in each magnetic recordinglayer obtained by TEM observation for d_(Ni) of 100 nm and for arealdensity of oxygen or carbon deposition of 2×10¹⁴ atom/cm² and of 4×10¹⁴atom/cm², respectively. When n is in a range from 1×10¹² grains/cm² to8×10¹² grains/cm², dPW₅₀ decreases desirably. When n is in a range from1×10¹² grains/cm² to 8×10¹² grains/cm², plural number of magneticcrystalline particles in the magnetic recording layer on one Nicrystalline grain on average was confirmed. Similar result was obtainedfor samples for Cu, Rh, and Pt grain diameter control under-layer.

Ordered arrangement of magnetic crystalline grains was examined formagnetic recording layer in-plane TEM Figure of each magnetic recordingmedium using an image processing and analyzing software “Image-Pro Plus”(Media Cybernetics Co., USA). In-plane TEM Figure for each magneticrecording layer was transformed into patterns expressed by two valuesincreasing contrast between regions of magnetic grains and other regionsand the pattern was transformed into a reciprocal lattice pattern by FFTand evaluated. As the result, no ordered arrangement could be found forconventional medium sample of Comparative Example 1.

On the other hand, every magnetic recording medium having n values in arange from 1×10¹² gains/cm² to 8×0¹² gains/cm², and having Ni, Rh and Cugrain diameter control under-layer, showed granular structured magneticrecording layer. FFT analysis for TEM Figure confirmed essentiallytetragonal arrangement of crystalline particles two periodical patternshowing 1:1/√2 relationship in distances from the center spot.

For every magnetic recording medium having Pt grain diameter controlunder-layer showed granular structured magnetic recording layer. FFTanalysis for TEM Figure confirmed essentially hexagonal arrangement ofcrystalline particles two periodical pattern showing 1:1/√3 relationshipin distances from the center spot.

EXAMPLE 2

Nonmagnetic 2.5 inches glass substrates were put into the vacuumchambers and the vacuum chambers were evacuated to 1×10⁻⁶ Pa or less.Then CoZrNb soft under-layer, Cu, Ni, Rh and Pt films were depositedrespectively, using the method described in Example 1.

Oxygen deposited layer was formed irradiating oxygen ions at 200 eVusing ion gun on the under-layer surface in oxygen atmosphere in a rangefrom 1×10⁻⁵ Pa to 1×10⁻² Pa. Then magnetic recording layer of a 5 nmCO₇₀Cr₁₀Pt₂₀—TiN was formed using CO₇₀Cr₁₀Pt₂₀-10 mol % TiN compositetarget. Magnetic recording layers replacing Co₇₀Cr₁₀Pt₂₀ by Fe₅₀—Pt₅₀,CO₅₀Pt₅₀ and CO₅₀Pd₅₀, and replacing TiN by AlN, TaN, TiC and TaC weredeposited respectively. Using similar procedure as described in Example1, carbon protective layer was deposited and lubricant layer was coated.Then, various magnetic recording media were prepared.

Table 2A and 2B show SNR_(m) values and dPW₅₀ values for each magneticrecording medium. Magnetic recording layer structure composite withchemical compound leads desirably increased magnetic recording mediumSNR_(m). Every composite magnetic recording layer including chemicalcompound showed granular structure, and magnetic crystalline grains onNi, Rh, and Cu grain diameter control under-layer showed orderedstructure arranged to form tetragonal lattice. On the other hand,magnetic crystalline grains on Pt grain diameter control under-layershowed ordered structure arranged to form hexagonal lattice.

TABLE 2A Diameter Control Magnetic Recording SNR_(m) dPW₅₀ ExampleUnder-layer Under-layer (dB) (nm) Example 2-1 Cu CoCrPt 16.0 92 Example2-2 Cu CoCrPt—TiN 16.5 85 Example 2-3 Cu CoCrPt—AlN 16.3 85 Example 2-4Cu CoCrPt—TaN 16.4 84 Example 2-5 Cu CoCrPt—Si₃N₄ 16.5 85 Example 2-6 CuCoCrPt—TiC 16.3 83 Example 2-7 Cu CoCrPt—TaC 16.3 83 Example 2-8 NiCoCrPt—TiN 16.7 83 Example 2-9 Ni CoCrPt—A1N 16.8 85 Example 2-10 NiCoCrPt—TaN 16.9 82 Example 2-11 Ni CoCrPt—Si₃N₄ 16.9 86 Example 2-12 NiCoCrPt—TiC 16.7 82 Example 2-13 Ni CoCrPt—TaC 16.6 83 Example 2-14 RhCoCrPt—TiN 16.3 84 Example 2-15 Rh CoCrPt—A1N 16.4 85 Example 2-16 RhCoCrPt—TaN 16.4 84 Example 2-17 Rh CoCrPt—Si₃N₄ 16.3 83 Example 2-18 RhCoCrPt—TiC 16.4 82 Example 2-19 Rh CoCrPt—TaC 16.4 82 Example 2-20 PtCoCrPt—TiN 16.4 84 Example 2-21 Pt CoCrPt—A1N 16.3 86 Example 2-22 PtCoCrPt—TaN 16.6 86 Example 2-23 Pt CoCrPt—Si₃N₄ 16.6 83 Example 2-24 PtCoCrPt—TiC 16.5 82 Example 2-25 Pt CoCrPt—TaC 16.6 85

TABLE 2B Diameter Control Magnetic Recording SNR_(m) dPW₅₀ ExampleUnder-layer Under-layer (dB) (nm) Example 2-26 Cu FePt 15.9 90 Example2-27 Cu FePt—TiN 16.4 84 Example 2-28 Cu FePt—A1N 16.4 82 Example 2-29Cu FePt—TaN 16.3 85 Example 2-30 Cu FePt—Si₃N₄ 16.7 84 Example 2-31 CuFePt—TiC 16.7 85 Example 2-32 Cu FePt—TaC 16.5 83 Example 2-33 NiFePt—TiN 16.5 82 Example 2-34 Ni FePt—A1N 16.7 84 Example 2-35 NiFePt—TaN 16.3 84 Example 2-36 Ni FePt—Si₃N₄ 16.2 85 Example 2-37 NiFePt—TiC 16.1 82 Example 2-38 Ni FePt—TaC 16.4 83 Example 2-39 RhFePt—TiN 16.3 83 Example 2-40 Rh FePt—A1N 16.3 82 Example 2-41 RhFePt—TaN 16.4 83 Example 2-42 Rh FePt—Si₃N₄ 16.6 84 Example 2-43 RhFePt—TiC 16.7 83 Example 2-44 Rh FePt—TaC 16.3 83 Example 2-45 PtFePt—TiN 16.3 83 Example 2-46 Pt FePt—A1N 16.5 84 Example 2-47 PtFePt—TaN 16.2 85 Example 2-48 Pt FePt—Si₃N₄ 16.4 84 Comparative(conventional 15.4 109 Example medium)

EXAMPLE 3

Nonmagnetic 2.5 inches glass substrates were put into the vacuumchambers and the vacuum chambers were evacuated to 2×10⁻⁶ Pa or less.Then on the CoZrNb soft under-layer, Cu, Ni, Rh or Pt film wasdeposited, and then deposited carbon layer was formed using the methoddescribed in example 1 to each substrate. Magnetic recording layer of a5 nm CO₇₀Cr₁₀Pt₂₀—SiO₂ was formed using 5 rim CO₇₀Cr₁₀Pt₂₀-10 mol % SiO₂composite target. Magnetic recording layers replacing CO₇₀Cr₁₀Pt₂₀ byFe₅₀—Pt₅₀, CO₅₀Pt₅₀ and Fe₅₀Pd₅₀, and replacing SiO₂ by TiO, Al₂O₃, TiN,AlN, and TaN, were deposited respectively. Using similar proceduredescribed in Example 1, carbon protective layer was deposited andlubricant layer was coated. Then, various magnetic recording media wereprepared.

Table 3A and 3B show SNR_(m) values and dPW₅₀ values for each magneticrecording medium. Magnetic recording layer structure composite withchemical compound leads desirably increased magnetic recording mediumSNR_(m). Every composite magnetic recording layer including chemicalcompound showed granular structure, and magnetic crystalline grains onNi, Rh, and Cu grain diameter control under-layer showed orderedstructure arranged to form tetragonal lattice. On the other hand,magnetic crystalline grains on Pt grain diameter control under-layershowed ordered structure arranged to form hexagonal lattice.

TABLE 3A Diameter Control Magnetic Recording SNR_(m) dPW₅₀ ExampleUnder-layer Under-layer (dB) (nm) Example 3-1 Cu CoCrPt 16.1 93 Example3-2 Cu CoCrPt—TiN 16.5 86 Example 3-3 Cu CoCrPt—A1N 16.6 84 Example 3-4Cu CoCrPt—TaN 16.4 81 Example 3-5 Cu CoCrPt—Si₃N₄ 16.6 85 Example 3-6 CuCoCrPt—TiC 16.5 81 Example 3-7 Cu CoCrPt—TaC 16.3 81 Example 3-8 NiCoCrPt—TiN 16.8 84 Example 3-9 Ni CoCrPt—A1N 16.7 83 Example 3-10 NiCoCrPt—TaN 16.9 84 Example 3-11 Ni CoCrPt—Si₃N₄ 16.6 82 Example 3-12 NiCoCrPt—TiC 16.5 85 Example 3-13 Ni CoCrPt—TaC 16.9 85 Example 3-14 RhCoCrPt—TiN 16.6 87 Example 3-15 Rh CoCrPt—A1N 16.5 83 Example 3-16 RhCoCrPt—TaN 16.5 81 Example 3-17 Rh CoCrPt—Si₃N₄ 16.6 84 Example 3-18 RhCoCrPt—TiC 16.3 80 Example 3-19 Rh CoCrPt—TaC 16.4 83 Example 3-20 PtCoCrPt—TiN 16.4 83 Example 3-21 Pt CoCrPt—A1N 16.5 81 Example 3-22 PtCoCrPt—TaN 16.3 80 Example 3-23 Pt CoCrPt—Si₃N₄ 16.4 81 Example 3-24 PtCoCrPt—TiC 16.5 83 Example 3-25 Pt CoCrPt—TaC 16.5 82

TABLE 3B Diameter Control Magnetic Recording SNR_(m) dPW₅₀ ExampleUnder-layer under-layer (dB) (nm) Example 3-26 Cu FePt 16.0 91 Example3-27 Cu FePt—TiN 16.4 84 Example 3-28 Cu FePt—A1N 16.5 85 Example 3-29Cu FePt—TaN 16.3 83 Example 3-30 Cu FePt—Si₃N₄ 16.4 86 Example 3-31 CuFePt—TiC 16.3 82 Example 3-32 Cu FePt—TaC 16.5 84 Example 3-33 NiFePt—TiN 16.3 83 Example 3-34 Ni FePt—A1N 16.7 80 Example 3-35 NiFePt—TaN 16.8 81 Example 3-36 Ni FePt—Si₃N₄ 16.3 84 Example 3-37 NiFePt—TiC 16.5 83 Example 3-38 Ni FePt—TaC 16.4 82 Example 3-39 RhFePt—TiN 16.3 82 Example 3-40 Rh FePt—A1N 16.4 82 Example 3-41 RhFePt—TaN 16.3 81 Example 3-42 Rh FePt—Si₃N₄ 16.5 83 Example 3-43 RhFePt—TiC 16.4 81 Example 3-44 Rh FePt—TaC 16.3 82 Example 3-45 PtFePt—TiN 16.5 83 Example 3-46 Pt FePt—A1N 16.7 84 Example 3-47 PtFePt—TaN, 16.8 84 Example 3-48 Pt FePt—Si₃N₄ 16.5 82 Example 3-49 PtFePt—TiC 16.7 85 Example 3-50 Pt FePt—TaC 16.4 85 Comparative(Conventional 15.4 109 Example Medium)

EXAMPLE 4

2.5 inch hard disk shaped nonmagnetic glass substrates were prepared andfilm depositions were performed using same process as shown in Example 1up to oxygen deposition treatment. Then 10 nm Pt—TiN was deposited usinga composite target of Pt-10 mol % TiN to each substrate. On the Pt—TiNlayer, 5 nm CO₇₀Cr₁₀Pt₂₀—SiO₂ magnetic recording layer was depositedusing CO₇₀Cr₁₀Pt₂₀-10% SiO₂ composite target.

Then various magnetic recording media were obtained depositing carbonprotective layer and coating lubricant layer using the proceduredescribed in Example 2. In addition, various magnetic recording mediawere prepared from the magnetic recording medium mentioned abovereplacing under-layer Pt by Pd, Ir, Ag, Cu, Ru and Rh, and replacing TiNby AlN, TaNSi₂N₃, TiC, and TaC, under-layer, respectively, werefabricated preparing targets for each deposition. Further more, magneticrecording layer of Fe₅₀—Pt₅₀, CO₅₀Pt₅₀ and Fe₅₀Pd₅₀ instead ofCO₇₀Cr₁₀Pt₂₀SiO₂, and TiO, Al₂O₃, TiN, AlN, TaN, TiC, and TaC instead ofSiO₂, were deposited respectively, preparing targets for eachdeposition.

Tables 4A and 4B show SNR_(m) values and dPW₅₀ values for every magneticrecording medium having CoCrPt—SiO₂ magnetic recording layer andrespective under-layers. Magnetic recording layer structure compositewith chemical compound showed increased magnetic recording mediumSNR_(m). Similar result was also found when other magnetic recordinglayer was applied. Every magnetic recording layer and under layer showedgranular structure, and magnetic recording media with Ni, Rh, and Cugrain diameter control under-layer showed essentially ordered structureof magnetic crystalline grains arranged to form tetragonal lattice. Onthe other hand, magnetic recording media with Pt grain diameter controlunder-layer showed ordered structure of magnetic crystalline grainsarranged to form hexagonal lattice.

TABLE 4A Intermediate SNR_(m) dPW₅₀ Example Under-layer [dB] [nm]Example 4-1 Pt 17.3 77 Example 4-2 Pd 17.3 78 Example 4-3 Ir 17.2 77Example 4-4 Ag 17.2 77 Example 4-5 Cu 17.2 76 Example 4-6 Ru 17.4 77Example 4-7 Rh 17.4 77 Example 4-8 Pt—TiN 17.8 74 Example 4-9 Pd—TiN17.6 75 Example 4-10 Ir—TiN 17.8 75 Example 4-11 Ag—TiN 17.5 74 Example4-12 Cu—TiN 17.4 74 Example 4-13 Ru—TiN 17.7 73 Example 4-14 Rh—TiN 17.773 Example 4-15 Pt—A1N 17.7 75 Example 4-16 Pd—A1N 17.7 73 Example 4-17Ir—A1N 17.5 72 Example 4-18 Ag—A1N 17.6 72 Example 4-19 Cu—A1N 17.6 74Example 4-20 Ru—A1N 17.8 73 Example 4-21 Rh—A1N 17.7 73 Example 4-22Pt—TaN 17.8 74 Example 4-23 Pd—TaN 17.5 72 Example 4-24 Ir—TaN 17.5 73Example 4-25 Ag—TaN 17.6 74 Example 4-26 Cu—TaN 17.5 73 Example 4-27Ru—TaN 17.7 73 Example 4-28 Rh—TaN 17.6 72

TABLE 4B Intermediate SNR_(m) dPW₅₀ Example Under-layer [dB] [nm]Example 4-29 Pt—Si₃N₄ 17.9 76 Example 4-30 Pd—Si₃N₄ 17.9 73 Example 4-31Ir—Si₃N₄ 17.7 74 Example 4-32 Ag—Si₃N₄ 17.7 74 Example 4-33 Cu—Si₃N₄17.8 75 Example 4-34 RU—Si₃N₄ 17.8 75 Example 4-35 Rh—Si₃N₄ 17.6 72Example 4-36 Pt—TiC 17.7 73 Example 4-37 Pd—TiC 17.9 73 Example 4-38Ir—TiC 17.6 74 Example 4-39 Ag—TiC 17.7 73 Example 4-40 Cu—TiC 17.5 72Example 4-41 Ru—TiC 17.8 74 Example 4-42 Rh—TiC 17.7 75 Example 4-43Pt—TaC 17.6 75 Example 4-44 Pd—TaC 17.8 75 Example 4-45 Ir—TaC 17.7 72Example 4-46 Ag—TaC 17.4 73 Example 4-47 Cu—TaC 17.3 73 Example 4-48Ru—TaC 17.8 74 Example 4-49 Rh—TaC 17.9 72 Comparative (Conventional15.4 109 Example medium)

EXAMPLE 5

2.5 inch hard disk shaped nonmagnetic glass substrates were prepared andfilm depositions were performed using the same procedure as shown inExample 1 up to carbon deposition treatment. Then 10 nm Pt—SiO₂ wasdeposited using Pt-10 mol % SiO₂ composite target. Various magneticrecording medium were fabricated depositing various magnetic recordinglayer on the Pt—SiO₂ layer, depositing carbon protective layer andcoating lubricant layer using the same fabricating conditions describedin Example 4. Furthermore, various magnetic recording media wereobtained replacing the Pt by Pd, Ir, Ag, Cu, Ru and Rh, and replacingthe SiO₂ by TiO, Al₂O₃, TiN, AlN, TaN, TiC, and TaC, respectively,preparing and using each respective target.

Tables 5A and 5B show SNR_(m) values and dPW₅₀ values for each magneticrecording medium having CoCrPt—SiO₂ magnetic recording layer andrespective under-layers. Disposing under-layer composite with chemicalcompound under the magnetic recording layer showed improvement ofmagnetic recording medium recording resolution. Similar result was alsofound when other magnetic recording layer was applied. Every magneticrecording layer and under layer showed granular structure, and magneticrecording media with Ni, Rh, and Cu grain diameter control under-layershowed essentially ordered structure of magnetic crystalline grainsarranged to form tetragonal lattice. On the other hand, magneticrecording media with Pt grain diameter control under-layer showedordered structure of magnetic crystalline grains arranged to formhexagonal lattice.

TABLE 5A Intermediate SNR_(m) dPW₅₀ Example Under-layer [dB] [nm]Example 5-1 Pt 17.3 78 Example 5-2 Pd 17.3 77 Example 5-3 Ir 17.2 78Example 5-4 Ag 17.3 79 Example 5-5 Cu 17.0 77 Example 5-6 Ru 17.3 77Example 5-7 Rh 17.1 78 Example 5-8 Pt—TiN 17.7 75 Example 5-9 Pd—TiN17.6 74 Example 5-10 Ir—TiN 17.6 73 Example 5-11 Ag—TiN 17.7 75 Example5-12 Cu—TiN 17.6 74 Example 5-13 Ru—TiN 17.8 72 Example 5-14 Rh—TiN 17.875 Example 5-15 Pt—A1N 17.8 75 Example 5-16 Pd—A1N 17.7 72 Example 5-17Ir—A1N 17.9 73 Example 5-18 Ag—A1N 17.6 74 Example 5-19 Cu—A1N 17.8 72Example 5-20 Ru—A1N 17.9 75 Example 5-21 Rh—A1N 17.9 73 Example 5-22Pt—TaN 17.7 74 Example 5-23 Pd—TaN 17.6 73 Example 5-24 Ir—TaN 17.7 74.Example 5-25 Ag—TaN 17.6 73 Example 5-26 Cu—TaN 17.7 74 Example 5-27Ru—TaN 17.9 73 Example 5-28 Rh—TaN 17.6 73

TABLE 5B Intermediate SNR_(m) dPW₅₀ Example Under-layer [dB] [run]Example 5-29 Pt—Si₃N₄ 17.8 74 Example 5-30 Pd—Si₃N₄ 17.9 72 Example 5-31Ir—Si₃N₄ 17.7 71 Example 5-32 Ag—Si₃N₄ 17.8 71 Example 5-33 Cu—Si₃N₄17.6 73 Example 5-34 Ru—Si₃N₄ 17.8 74 Example 5-35 Rh—Si₃N₄ 17.9 75Example 5-36 Pt—TiC 17.9 75 Example 5-37 Pd—TiC 17.6 75 Example 5-38Ir—TiC 17.7 73 Example 5-39 Ag—TiC 17.6 72 Example 5-40 Cu—TiC 17.7 74Example 5-41 Ru—TiC 17.9 73 Example 5-42 Rh—TiC 17.9 72 Example 5-43Pt—TaC 17.8 73 Example 5-44 Pd—TaC 17.8 74 Example 5-45 Ir—TaC 17.6 75Example 5-46 Ag—TaC 17.6 75 Example 5-47 Cu—TaC 17.6 73 Example 5-48Ru—TaC 17.8 74 Example 5-49 Rh—TaC 17.7 73 Comparative (conventional15.4 109 Example medium)

EXAMPLE 6

2.5 inch hard disk shaped nonmagnetic glass substrates were prepared andvarious magnetic recording media were fabricated using the fabricatingprocedure of Example 4 except that an orientation control layer wasdisposed between soft magnetic under-layer and grain diameter controllayer. Then various magnetic recording media were obtained. As theorientation control layer, 5 nm thick NiAl layer was deposited in 0.7 PaAr atmosphere preparing and using NiAl targets. In addition, magneticrecording media having orientation control layer of MgO, NiO, MnAl, Ge,Si and TN, respectively, are fabricated.

Table 6 shows the recording and reproducing characteristics of eachmagnetic recording medium having CoCrPt—SiO₂ magnetic recording layerand Pt—TiN under-layer. It was found that the SNR_(m), further increasesby disposing the orientation control under-layer. Similar results wereobtained for other magnetic recording media having other magneticrecording layer and under-layer combinations.

TABLE 6 Orientation Control Diameter Control SNR_(m) dPW₅₀ ExampleUnder-layer Under-layer [dB] [nm] Example 6-1 None Cu 17.7 73 Example6-2 NiAl Cu 18.1 71 Example 6-3 MgO Cu 18.2 70 Example 6-4 NiO Cu 18.370 Example 6-5 MnAl Cu 18.1 71 Example 6-6 Ge Cu 18.1 70 Example 6-7 SiCu 18.3 69 Example 6-8 TiN Cu 18.2 69 Example 6-9 None Ni 17.8 74Example 6-10 NiAl Ni 18.4 70 Example 6-11 MgO Ni 18.2 70 Example 6-12NiO Ni 18.4 70 Example 6-13 MnAl Ni 18.2 69 Example 6-14 Ge Ni 18.2 70Example 6-15 Si Ni 18.3 71 Example 6-16 TiN Ni 18.4 71 Example 6-17 NoneRh 17.5 75 Example 6-18 NiAl Rh 18.0 69 Example 6-19 MgO Rh 18.2 69Example 6-20 NiO Rh 18.2 70 Example 6-21 MnAl Rh 18.3 71 Example 6-22 GeRh 18.3 71 Example 6-23 Si Rh 18.3 70 Example 6-24 TiN Rh 18.2

EXAMPLE 7

2.5 inch hard disk shaped nonmagnetic glass substrates were prepared andvarious magnetic recording media were fabricated using the fabricatingprocedure of Example 5 except that an orientation control layer wasdisposed between soft magnetic under-layer and grain diameter controllayer. Table 7 shows the recording and reproducing characteristics ofeach magnetic recording medium having CoCrPt—SiO₂ magnetic recordinglayer and Pt—TiN under-layer. It was found that the SNR_(m), furtherincreases by disposing the orientation control under-layer. Similarresults were obtained for other magnetic recording media having othermagnetic recording layer and under-layer combinations.

TABLE 7 Orientation Control Diameter Control SNR_(m) dPW₅₀ ExampleUnder-layer Under-layer [dB] [nm] Example 7-1 None Cu 17.6 76 Example7-2 NiAl Cu 18.4 70 Example 7-3 MgO Cu 18.3 71 Example 7-4 NiO Cu 18.471 Example 7-5 MnAl Cu 18.5 72 Example 7-6 Ge Cu 18.2 71 Example 7-7 SiCu 18.3 69 Example 7-8 None Ni 17.7 75 Example 7-9 NiAl Ni 18.3 71Example 7-10 MgO Ni 18.3 69 Example 7-11 NiO Ni 18.2 72 Example 7-12MnAl Ni 18.4 70 Example 7-13 Ge Ni 18.2 71 Example 7-14 Si Ni 18.3 70Example 7-15 None Rh 17.6 77 Example 7-16 NiAl Rh 18.3 69 Example 7-17MgO Rh 18.2 68 Example 7-18 NiO Rh 18.4 72 Example 7-19 MnAl Rh 18.3 70Example 7-20 Ge Rh 18.2 69 Example 7-21 Si Rh 18.4 71

Although the prevent invention has been shown and described with respectto best mode embodiments thereof, it should be understood by thoseskilled in art that the foregoing and various other changes in the formand detail without departing from the spirit and scope of the presentinvention.

1. A method for producing magnetic recording medium, comprising: aprocess for forming a grain diameter control under-layer comprisingcrystalline grains of at least one selected from the group consistingessentially of Cu, Ni, Rh and Pt on a substrate; a process for formingan deposited atom layer of at least one element selected from the groupconsisting of oxygen and carbon atoms on the grain diameter controllayer surface; and a process for forming a magnetic recording layer onthe deposited atom layer formed grain diameter control under-layer onthe substrate.
 2. The method for producing magnetic recording medium asset forth in claim 1, wherein the deposited atom layer at least oneelement selected from the group consisting of oxygen and carbon atoms inan average areal density range from 1×10¹³ atoms/cm² to 1×10¹⁵ atoms/cm²is formed at the process for forming an deposited atom layer.
 3. Themethod for producing magnetic recording medium as set forth in claim 1,wherein the grain diameter control under-layer comprising 50 nm orlarger than 50 nm crystalline grains of at least one selected from thegroup consisting essentially of Cu, Ni, Rh and Pt is formed at theprocess for forming a grain diameter control under-layer, and theelement deposited atom layer at least one element selected from thegroup consisting of oxygen and carbon is formed on the grain diametercontrol under-layer surface at the process for forming an deposited atomlayer.
 4. The method for producing magnetic recording medium as setforth in claim 1, wherein the grain diameter control layer comprisingthe crystalline grains of at least one selected from the groupconsisting essentially of Cu, Ni, and Rh oriented their (100) planesparallel to the substrate surface is formed at the process for forming agrain diameter control layer.
 5. The method for producing magneticrecording medium as set forth in claim 1, wherein the magneticcrystalline grains are arranged essentially in a form of tetragonallattice structure in the magnetic recording-layer plane at the processof forming a magnetic recording-layer.
 6. The method for producingmagnetic recording medium as set forth in claim 1, wherein the graindiameter control layer comprising the crystalline grains of Pt orientedtheir (111) planes parallel to the substrate surface is formed at theprocess for forming a grain diameter control layer.
 7. The method forproducing magnetic recording medium as set forth in claim 6, wherein themagnetic crystalline grains are arranged essentially in a form ofhexagonal lattice structure in the magnetic recording-layer plane at theprocess of forming a magnetic recording-layer.
 8. The method forproducing magnetic recording medium as set forth in claim 1, wherein themagnetic crystalline grains in the magnetic recording-layer are formedin an average areal density range from 1×10¹² grains/cm² to 8×10¹²grains/cm² at the process for forming a magnetic recording-layer.